master's thesis
Defect formation in semiconductor detectors by irradiation with focused ion beams of different properties

Andreo Crnjac (2018)
University of Zagreb
Faculty of Science
Department of Physics
Cite this document...

Crnjac, A. (2018). Tvorba defekata u poluvodičkim detektorima ozračivanjem fokusiranim ionskim snopovima različitih karakteristika (Master's thesis). Retrieved from https://urn.nsk.hr/urn:nbn:hr:217:948914

Crnjac, Andreo. "Tvorba defekata u poluvodičkim detektorima ozračivanjem fokusiranim ionskim snopovima različitih karakteristika." Master's thesis, University of Zagreb, Faculty of Science, 2018. https://urn.nsk.hr/urn:nbn:hr:217:948914

Crnjac, Andreo. "Tvorba defekata u poluvodičkim detektorima ozračivanjem fokusiranim ionskim snopovima različitih karakteristika." Master's thesis, University of Zagreb, Faculty of Science, 2018. https://urn.nsk.hr/urn:nbn:hr:217:948914

Crnjac, A. (2018). 'Tvorba defekata u poluvodičkim detektorima ozračivanjem fokusiranim ionskim snopovima različitih karakteristika', Master's thesis, University of Zagreb, Faculty of Science, accessed 25 March 2019, https://urn.nsk.hr/urn:nbn:hr:217:948914

Crnjac A. Tvorba defekata u poluvodičkim detektorima ozračivanjem fokusiranim ionskim snopovima različitih karakteristika [Master's thesis]. Zagreb: University of Zagreb, Faculty of Science; 2018 [cited 2019 March 25] Available at: https://urn.nsk.hr/urn:nbn:hr:217:948914

A. Crnjac, "Tvorba defekata u poluvodičkim detektorima ozračivanjem fokusiranim ionskim snopovima različitih karakteristika", Master's thesis, University of Zagreb, Faculty of Science, Zagreb, 2018. Available at: https://urn.nsk.hr/urn:nbn:hr:217:948914